• DocumentCode
    1819771
  • Title

    A comparison of Return voltage measurement and frequency domain spectroscopy test on high voltage insulation

  • Author

    Xu, Shuzhen ; Middleton, Rick ; Fetherston, F. ; Pantalone, Donato

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Newcastle Univ., NSW, Australia
  • Volume
    1
  • fYear
    2003
  • fDate
    1-5 June 2003
  • Firstpage
    351
  • Abstract
    Return voltage measurement (RVM) and low frequency domain spectroscopy (FDS) have been successfully used to assess moisture content of oil/paper insulation. This paper is focused on modeling the dielectric response of transformer insulation with RVM data and FDS data respectively to get a relationship between these two methods and to facilitate a better interpretation of test results. The model is based on linear dielectric response theory. A nonlinear least squares optimization algorithm is used to estimate the parameters in the model. Experiments have been performed on two transformers in the Pacific Power Advanced Technology Center (ATC). When the transformer is relatively "dry" good agreement was obtained between these two methods, but some difference was found when moisture content of oil/paper insulation in transformer increases.
  • Keywords
    dielectric materials; electric strength; frequency-domain analysis; insulating oils; insulation testing; least squares approximations; moisture; paper; power transformer insulation; frequency domain spectroscopy test; high voltage insulation; linear dielectric response theory; low frequency domain spectroscopy; moisture content; nonlinear least squares optimization algorithm; oil/paper insulation; return voltage measurement; transformer insulation; Dielectrics and electrical insulation; Frequency domain analysis; Insulation testing; Least squares approximation; Moisture; Oil insulation; Petroleum; Power transformer insulation; Spectroscopy; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
  • ISSN
    1081-7735
  • Print_ISBN
    0-7803-7725-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.2003.1218424
  • Filename
    1218424