• DocumentCode
    1820233
  • Title

    Statistics of populations of images and its embedded objects: driving applications in neuroimaging

  • Author

    Gerig, G. ; Joshi, S. ; Fletcher, T. ; Gorczowski, K. ; Xu, S. ; Pizer, S.M. ; Styner, M.

  • Author_Institution
    Dept. of Comput. Sci., North Carolina Univ., Chapel Hill, NC
  • fYear
    2006
  • fDate
    6-9 April 2006
  • Firstpage
    1120
  • Lastpage
    1123
  • Abstract
    Work in progress towards modeling shape statistics of multi-object complexes is presented. Constraints defined by the set of objects such as a compact representation of object shape relationships and correlation of shape changes might have advantages for automatic segmentation and group discrimination. We present a concept for statistical multi-object modeling and discuss the major challenges which are a reduction to a small set of descriptive features, calculation of mean and variability via curved statistics, the choice of aligning sets of multiple objects, and the problem of describing the statistics of object pose and object shape and their interrelationship. Shape modeling and analysis is demonstrated with an application to a longitudinal autism study, with shape modeling of sets of 10 subcortical structures in a population of 20 subjects
  • Keywords
    biomedical MRI; brain; diseases; image segmentation; medical image processing; neurophysiology; statistical analysis; MRI; automatic segmentation; compact object shape relationship representation; curved statistics; embedded objects; group discrimination; longitudinal autism study; multiobject complexes; neuroimaging; shape change correlation; shape modeling; statistical multiobject modeling; statistical shape modeling; subcortical structures; Application software; Biomedical imaging; Computer science; Deformable models; Image analysis; Magnetic resonance imaging; Neuroimaging; Psychiatry; Shape; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-9576-X
  • Type

    conf

  • DOI
    10.1109/ISBI.2006.1625119
  • Filename
    1625119