DocumentCode
1821983
Title
Technological regime and knowledge productivity: An industry-level analysis of Chinese manufacturing
Author
Guo, Bin ; Chen, Xiaoling
Author_Institution
Sch. of Manage., Zhejiang Univ., Hangzhou, China
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
1047
Lastpage
1051
Abstract
Based on the knowledge production function framework, this article uses industry-level data of Chinese large and medium-size manufacturing enterprises over the period of 1996-2001 to explore the influences of technological regime on efficiency of knowledge production, as well as the potential complementary or crowded-out effects of technology transfer and inter-industry R&D spillover upon in-house R&D in knowledge creation. The empirical results reveal that for efficiency in knowledge production, scale economies, speed of obsolescence of knowledge, and accessibility of external knowledge in foreign technology transfer have positive contributions. But the relative reliance on inter-industry R&D spillover shows negative impact on knowledge productivity. Finally, this article provides an explanation based on the threshold effect of in-house R&D to the issue why the literature concerning complementary or substitution effect between foreign technology transfer and indigenous R&D lead to a mixed result in the context of developing countries.
Keywords
knowledge management; manufacturing industries; research and development; small-to-medium enterprises; technology transfer; Chinese manufacturing; industry-level analysis; interindustry R&D spillover; knowledge production function framework; knowledge productivity; technological regime; technology transfer; Economics; Manufacturing industries; Productivity; Technological innovation; Technology transfer; Knowledge productivity; Manufacturing industry; R&D spillover; Technological regime;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674237
Filename
5674237
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