• DocumentCode
    1822119
  • Title

    Deconvolution of 3D fluorescence micrographs with automatic risk minimization

  • Author

    Ramani, Sathish ; Vonesch, Cedric ; Unser, Michael

  • Author_Institution
    Biomed. Imaging Group, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    732
  • Lastpage
    735
  • Abstract
    We investigate the problem of automatic tuning of a deconvolution algorithm for three-dimensional (3D) fluorescence microscopy; specifically, the selection of the regularization parameter lambda. For this, we consider a realistic noise model for data obtained from a CCD detector: Poisson photon-counting noise plus Gaussian read-out noise. Based on this model, we develop a new risk measure which unbiasedly estimates the original mean-squared-error of the deconvolved signal estimate. We then show how to use this risk estimate to optimize the regularization parameter for Tikhonov-type deconvolution algorithms. We present experimental results on simulated data and numerically demonstrate the validity of the proposed risk measure. We also present results for real 3D microscopy data.
  • Keywords
    Gaussian noise; biomedical optical imaging; deconvolution; fluorescence; image enhancement; medical image processing; optical microscopy; CCD detector; Gaussian read-out noise; Poisson photon-counting noise; Tikhonov-type deconvolution; automatic risk minimization; deconvolution algorithm; image formation model; noise model; three-dimensional fluorescence microscopy; unbiased risk estimate; Additive noise; Background noise; Biomedical measurements; Charge coupled devices; Deconvolution; Detectors; Fluorescence; Gaussian noise; Microscopy; Risk management; 3D fluorescence microscopy; CCD Noise; Deconvolution; Unbiased risk estimate (URE);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541100
  • Filename
    4541100