DocumentCode
1822353
Title
Electric field dependence of luminescence due to alpha-particles in gaseous xenon and the energy expended per photon
Author
Saito, Masaki ; Nishikawa, Tsuguo ; Miyajima, Mitsuhiro
Author_Institution
Dept. of Eng., Fukui Univ., Japan
Volume
1
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
665
Abstract
The scintillation yield of gaseous xenon is measured as the function of electric field strength under the pressures of 1.0 and 2.0 atm. The scintillation yield rapidly decreases as the electric field increases and reaches a constant yield at higher electric field strength. The constant scintillation yield is suggested to determine the Ws-value defined as an average energy expended per photon. In this study, the Ws-value is obtained to be 59.4 ± 1.5 eV and the ratio of average scintillation yield to average ionization one is calculated to be 0.37 ± 0.01, which agrees well to Platzman´s prediction.
Keywords
alpha-particle detection; gas scintillation detectors; ionoluminescence; xenon; 59.4 eV; Xe; alpha-particles; average scintillation yield; electric field dependence; electric field strength; energy expended per photon; gaseous xenon; luminescence; scintillation yield; Atomic measurements; Electric variables measurement; Electrons; Ionization chambers; Luminescence; Photomultipliers; Photonics; Pressure measurement; Spontaneous emission; Xenon;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352129
Filename
1352129
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