• DocumentCode
    1822353
  • Title

    Electric field dependence of luminescence due to alpha-particles in gaseous xenon and the energy expended per photon

  • Author

    Saito, Masaki ; Nishikawa, Tsuguo ; Miyajima, Mitsuhiro

  • Author_Institution
    Dept. of Eng., Fukui Univ., Japan
  • Volume
    1
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    665
  • Abstract
    The scintillation yield of gaseous xenon is measured as the function of electric field strength under the pressures of 1.0 and 2.0 atm. The scintillation yield rapidly decreases as the electric field increases and reaches a constant yield at higher electric field strength. The constant scintillation yield is suggested to determine the Ws-value defined as an average energy expended per photon. In this study, the Ws-value is obtained to be 59.4 ± 1.5 eV and the ratio of average scintillation yield to average ionization one is calculated to be 0.37 ± 0.01, which agrees well to Platzman´s prediction.
  • Keywords
    alpha-particle detection; gas scintillation detectors; ionoluminescence; xenon; 59.4 eV; Xe; alpha-particles; average scintillation yield; electric field dependence; electric field strength; energy expended per photon; gaseous xenon; luminescence; scintillation yield; Atomic measurements; Electric variables measurement; Electrons; Ionization chambers; Luminescence; Photomultipliers; Photonics; Pressure measurement; Spontaneous emission; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352129
  • Filename
    1352129