Measurement based amplifier design

Author

Toner, B. ; Fusco, V.F.

Author_Institution

Dept. of Electr. & Electron. Eng., Queen´´s Univ., Belfast, UK

fYear

2001

fDate

2001

Firstpage

94

Lastpage

99

Abstract

In this paper, the development of a turnkey, multi-functional measurement system is described. It is electronically reconfigurable and allows for the on-wafer design of an amplifier to a given specification. All primary amplifier measurements can be completed such as S-parameters, minimum noise figure, source/load pull, harmonic power and intermodulation. In addition, real time voltage/current waveforms of the amplifier can be monitored and dynamic loadlines produced. The requirement for more linear amplifiers has also been addressed in this paper with the low frequency feedback technique being implemented for the first time on MOS technology and on-wafer

Keywords

CMOS analogue integrated circuits; MMIC amplifiers; MOSFET; S-parameters; UHF amplifiers; feedback amplifiers; integrated circuit design; intermodulation measurement; semiconductor device measurement; semiconductor device noise; MOS technology; S-parameter measurements; amplifier specification; dynamic loadlines; electronically reconfigurable system; harmonic power measurements; intermodulation measurements; linear amplifiers; low frequency feedback technique; measurement based amplifier design; minimum noise figure measurements; multi-functional measurement system; on-wafer amplifier design; on-wafer implementation; primary amplifier measurements; real-time amplifier voltage/current waveforms; source/load pull measurements; Feedback; Frequency; Monitoring; Noise figure; Noise measurement; Power amplifiers; Power measurement; Power system harmonics; Scattering parameters; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

High Frequency Postgraduate Student Colloquium, 2001. 6th IEEE

Conference_Location

Cardiff

Print_ISBN

0-7803-7118-6

Type

conf

DOI

10.1109/HFPSC.2001.962172

Filename

962172