DocumentCode
1824705
Title
Two new unexplained and unresolved HBM tester related failures
Author
Ward, Scott ; Burgess, Keith ; Kunz, Hans ; Duvvury, Charvaka ; Schichl, Joe ; Rost, Tim
Author_Institution
Texas Instrum., Dallas, TX, USA
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
7
Abstract
Two new unexplained HBM tester related failures are introduced. Sufficient data has been collected to conclude these failures to be tester related, examples where the tester is not producing reproducible results. One failure is due to stressing multiple samples in parallel and the second is cumulative pulse-related.
Keywords
electrostatic discharge; failure analysis; test equipment; ESD qualification; containment solution; cumulative pulse-related; failures; unresolved HBM tester; EPROM; Electrostatic discharge; Fixtures; Pins; Sockets; Stress; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045615
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