DocumentCode
1824952
Title
New RF Test Methods Using Waveform Synthesis from Digital Data
Author
Kuhn, Nicholas J.
Author_Institution
Hewlett-Packard Co. Inc., Palo Alto, CA
Volume
9
fYear
1986
fDate
31564
Firstpage
72
Lastpage
84
Keywords
Automatic testing; Binary phase shift keying; Demodulation; Phase distortion; Phase shift keying; RF signals; Radio frequency; Signal synthesis; Synthesizers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location
Baltimore, MD, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1986.323664
Filename
4119070
Link To Document