• DocumentCode
    1825054
  • Title

    An Improved Open for Calibrating Sexed VANA Test Ports

  • Author

    Simpson, Gary R.

  • Author_Institution
    Maury Microwave Corporation, Cucamonga, CA
  • Volume
    9
  • fYear
    1986
  • fDate
    31564
  • Firstpage
    112
  • Lastpage
    120
  • Abstract
    The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA´s) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.
  • Keywords
    Automatic testing; Calibration; Capacitance; Circuit testing; Conductors; Connectors; Contacts; Geometry; Loss measurement; Microwave circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 27th ARFTG
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1986.323667
  • Filename
    4119073
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1825054