• DocumentCode
    1825120
  • Title

    A Calibration Method for De-Embedding a Microwave Test Fixture

  • Author

    Rosenbaum, S.E. ; Pitzalis, O., Jr. ; Marzan, J.M.

  • Author_Institution
    Hughes Research Laboratories, Malibu, CA 90265
  • Volume
    9
  • fYear
    1986
  • fDate
    31564
  • Firstpage
    148
  • Lastpage
    158
  • Abstract
    A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.
  • Keywords
    Calibration; Circuit testing; Fixtures; Integrated circuit measurements; Integrated circuit testing; MMICs; Microwave devices; Microwave measurements; Microwave theory and techniques; Microwave transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 27th ARFTG
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1986.323670
  • Filename
    4119076
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1825120