DocumentCode
1825144
Title
Oblique incidence at a gyroelectric/dielectric interface at sub-terahertz and terahertz frequencies
Author
Mok, V.H. ; Davis, L.E.
Author_Institution
Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
fYear
2001
fDate
2001
Firstpage
158
Lastpage
163
Abstract
Expressions for the Reflection coefficient for oblique incidence at an interface between a dielectric and a magnetised semiconductor are presented in this paper. An effective permittivity, εeff and a transverse propagation coefficient, keff for an infinite gyroelectric medium have been derived for the case in which the electric field is perpendicular to the applied magnetic field. Graphs of effective permittivity versus frequency for Indium Antimonide (InSb) at room temperature (300 K) for both the lossless and lossy cases are shown together with the effects of the positive and the negative region. The dependence of the complex Reflection coefficient on both the frequency and the angle of incidence, including the concept of critical angle, are also presented
Keywords
III-V semiconductors; electromagnetic wave reflection; indium compounds; permittivity; semiconductor-insulator boundaries; submillimetre wave propagation; 300 K; InSb; critical angle; effective permittivity; gyroelectric/dielectric interface; indium antimonide; magnetised semiconductor; oblique incidence; reflection coefficient; sub-terahertz frequency; terahertz frequency; transverse propagation coefficient; Dielectric losses; Electrons; Equations; Frequency; Indium; Magnetic semiconductors; Permittivity; Plasma temperature; Reflection; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
High Frequency Postgraduate Student Colloquium, 2001. 6th IEEE
Conference_Location
Cardiff
Print_ISBN
0-7803-7118-6
Type
conf
DOI
10.1109/HFPSC.2001.962190
Filename
962190
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