• DocumentCode
    182688
  • Title

    Temperature and bias dependent ferrite bead inductor modeling

  • Author

    Morales, H. ; Connick, R. ; Weller, Tom ; Dunleavy, Larry

  • Author_Institution
    Modelithics, Inc., Tampa, FL, USA
  • fYear
    2014
  • fDate
    6-6 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Novel measurement-based models are described for ferrite bead inductor behavior at RF and microwave frequencies. Ferrite bead components are used in various applications from electromagnetic interference suppression to reduction of undesired signals in many high frequency designs. The newly developed equivalent circuit model can accurately predict the strong impedance dependence versus bias, frequency and temperature of a surface mount chip ferrite bead. This new solution gives the designer great flexibility and excellent accuracy when such a model is used in their RF simulation designs. Measurement validation of the modeling methods are illustrated for two different commercially available surface mount ferrite bead devices demonstrating accurate predictions of impedance over bias and temperature in the DC to 6 GHz frequency range.
  • Keywords
    circuit simulation; electric impedance; equivalent circuits; ferrite devices; inductors; interference suppression; microwave circuits; microwave propagation; printed circuits; radiofrequency interference; surface mount technology; DC; RF; electromagnetic interference suppression; equivalent circuit model; ferrite bead inductor; ferrite bead inductor modeling; frequency 6 GHz; measurement-based model; microwave frequencies; surface mount chip ferrite bead devices; undesired signal reduction; Data models; Equivalent circuits; Ferrites; Impedance; Integrated circuit modeling; Temperature dependence; Temperature measurement; bias; ferrite bead; impedance; inductor; modeling; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless and Microwave Technology Conference (WAMICON), 2014 IEEE 15th Annual
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/WAMICON.2014.6857775
  • Filename
    6857775