A CMOS VLSI IC for real-time opto-electronic two-dimensional histogram generation

Author

Richstein, J.K. ; Fouts, D.J. ; Pieper, R.J. ; Poon, T.-C.

Author_Institution

Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA

fYear

1994

fDate

20-22 Mar 1994

Firstpage

390

Lastpage

394

Abstract

Histogram generation, a standard image processing operation, is a record of the intensity distribution in the image. A prototype of an optical-electronic histogram generator has been designed and tested for 1D objects using wirewrapped MSI TTL components (Richstein et al. 1993). The overall system design is such that the electronic signal obtained from the optically scanned two-dimensional semi-opaque image is processed and displayed within a period of one cycle of the scanning process. The authors report a VLSI design to be used in a two-dimensional real-time histogram generation scheme

Keywords

CMOS integrated circuits; VLSI; digital signal processing chips; image scanners; image sequences; integrated optoelectronics; real-time systems; CMOS VLSI IC; design; electronic signal; image processing; intensity distribution; optically scanned two-dimensional semiopaque image; real-time optoelectronic two-dimensional histogram generation; test; transistor transistor logic; wirewrapped MSI TTL components; CMOS integrated circuits; Histograms; Image generation; Image processing; Optical design; Optical devices; Optical recording; Prototypes; Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

System Theory, 1994., Proceedings of the 26th Southeastern Symposium on

Conference_Location

Athens, OH

ISSN

0094-2898

Print_ISBN

0-8186-5320-5

Type

conf

DOI

10.1109/SSST.1994.287846

Filename

287846