• DocumentCode
    1828360
  • Title

    A universal framework for managed built-in test

  • Author

    Maunder, Colin

  • Author_Institution
    BT Lab., Ipswich, UK
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    21
  • Lastpage
    29
  • Abstract
    An approach to systems test is presented that builds on earlier work by several design-for-test and test management standards committees and research teams. The approach is based on a generic model of a managed built-in test process supported by standard test descriptions
  • Keywords
    IEEE standards; automatic test equipment; built-in self test; design for testability; management; measurement standards; built-in test; design-for-test; test management standards committees; Assembly systems; Built-in self-test; Circuit faults; Circuit testing; Costs; Life testing; Performance evaluation; Printed circuits; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470722
  • Filename
    470722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1828360