• DocumentCode
    1828716
  • Title

    Evaluation of production yield for process selection

  • Author

    Lin, Chen-ju ; Kuo, Hsin-hui

  • Author_Institution
    Dept. of Ind. Eng. & Manage., Yuan Ze Univ., Chungli, Taiwan
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    458
  • Lastpage
    462
  • Abstract
    Process evaluation is a common yet important problem in industry. Among the key measurements such as quality, processing time, cost, and robustness, production yield is one of the fundamental criteria frequently adopted to evaluate the quality level of a process. A process with high yield is better capable of producing products meeting the requirements preset by customers. However, general evaluation procedures that count the number of defectives become inefficient especially when yield rates are high. This paper considers the processes evaluation problem by comparing the yield index Spk of two production lines with high quality. An effective and efficient approach is proposed to solve the problem. The analytical method examines the difference of two yields. The approach requires small sample sizes but sensitively distinguishes production yields. The results provide useful information to practitioners.
  • Keywords
    manufacturing processes; production management; quality management; evaluation procedures; process evaluation; process selection; production lines; production yield evaluation; quality level; yield index; yield rates; Indexes; Light emitting diodes; Manufacturing processes; Semiconductor device measurement; Testing; Quality management; process evaluation; yield;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674490
  • Filename
    5674490