DocumentCode
1828716
Title
Evaluation of production yield for process selection
Author
Lin, Chen-ju ; Kuo, Hsin-hui
Author_Institution
Dept. of Ind. Eng. & Manage., Yuan Ze Univ., Chungli, Taiwan
fYear
2010
fDate
7-10 Dec. 2010
Firstpage
458
Lastpage
462
Abstract
Process evaluation is a common yet important problem in industry. Among the key measurements such as quality, processing time, cost, and robustness, production yield is one of the fundamental criteria frequently adopted to evaluate the quality level of a process. A process with high yield is better capable of producing products meeting the requirements preset by customers. However, general evaluation procedures that count the number of defectives become inefficient especially when yield rates are high. This paper considers the processes evaluation problem by comparing the yield index Spk of two production lines with high quality. An effective and efficient approach is proposed to solve the problem. The analytical method examines the difference of two yields. The approach requires small sample sizes but sensitively distinguishes production yields. The results provide useful information to practitioners.
Keywords
manufacturing processes; production management; quality management; evaluation procedures; process evaluation; process selection; production lines; production yield evaluation; quality level; yield index; yield rates; Indexes; Light emitting diodes; Manufacturing processes; Semiconductor device measurement; Testing; Quality management; process evaluation; yield;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location
Macao
ISSN
2157-3611
Print_ISBN
978-1-4244-8501-7
Electronic_ISBN
2157-3611
Type
conf
DOI
10.1109/IEEM.2010.5674490
Filename
5674490
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