• DocumentCode
    1829926
  • Title

    Low contact resistance series MEMS switches

  • Author

    Peroulis, D. ; Sarabandi, K. ; Katehi, L.P.B.

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    223
  • Abstract
    This paper reports on the design and development of a novel DC-contact MEMS switch for microwave applications. The switching operation utilizes two different forces: electrostatic and stress-induced forces. The former is employed as the actuation force, while the latter is responsible for achieving the actual DC contact. In particular, when no bias voltage is applied, the deformation of a metallic cantilever beam caused by residual gradient stress leads to a metal-to-metal contact. On the other hand, when a DC-voltage is applied between the cantilever beam and an actuation electrode, the cantilever deflects due to electrostatic force and the metallic contact ceases to exist. Contact resistance of less than 1 /spl Omega/ is demonstrated with this technique in the closed position, which corresponds to an RF insertion loss of 0.1-0.2 dB up to 40 GHz. In this switch the contact force does not depend on the actuation voltage and there is no DC potential across the closed contact, which constitute the main advantages of this design.
  • Keywords
    contact resistance; electrostatic actuators; micromechanical devices; microwave switches; millimetre wave devices; 0.1 to 0.2 dB; 1 ohm; 40 GHz; DC-contact MEMS switch; RF MEMS switches; actuation force; electrostatic forces; fabrication process; low contact resistance series switches; metal-to-metal contact; metallic cantilever beam deformation; microwave applications; residual gradient stress; stress-induced forces; Contact resistance; Electrodes; Electrostatics; Insertion loss; Microswitches; Radio frequency; Residual stresses; Structural beams; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011598
  • Filename
    1011598