DocumentCode
1830864
Title
Chinese textual entailment with Wordnet semantic and dependency syntactic analysis
Author
Chun Tu ; Min-Yuh Day
Author_Institution
Dept. of Inf. Manage., Tamkang Univ., Taipei, Taiwan
fYear
2013
fDate
14-16 Aug. 2013
Firstpage
69
Lastpage
74
Abstract
Recognizing Inference in TExt (RITE) is a task for automatically detecting entailment, paraphrase, and contradiction in texts which addressing major text understanding in information access research areas. In this paper, we proposed a Chinese textual entailment system using Wordnet semantic and dependency syntactic approaches in Recognizing Inference in Text (RITE) using the NTCIR-10 RITE-2 subtask datasets. Wordnet is used to recognize entailment at lexical level. Dependency syntactic approach is a tree edit distance algorithm applied on the dependency trees of both the text and the hypothesis. We thoroughly evaluate our approach using NTCIR-10 RITE-2 subtask datasets. As a result, our system achieved 73.28% on Traditional Chinese Binary-Class (BC) subtask and 74.57% on Simplified Chinese Binary-Class subtask with NTCIR-10 RITE-2 development datasets. Thorough experiments with the text fragments provided by the NTCIR-10 RITE-2 subtask showed that the proposed approach can improve system´s overall accuracy.
Keywords
natural language processing; text analysis; trees (mathematics); Chinese textual entailment; NTCIR-10 RITE-2 development datasets; NTCIR-10 RITE-2 subtask datasets; RITE; Wordnet semantic; dependency syntactic analysis; dependency trees; information access research areas; lexical level; recognizing inference in text; simplified Chinese Binary-class subtask; text fragments; text understanding; tree edit distance algorithm; Accuracy; Predictive models; Semantics; Support vector machines; Syntactics; Text recognition; Training; Dependency Analysis; Machine Learning; Semantic Features; Support Vector Machine (SVM); Syntactic Features; Textual Entailment; WordNet;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Reuse and Integration (IRI), 2013 IEEE 14th International Conference on
Conference_Location
San Francisco, CA
Type
conf
DOI
10.1109/IRI.2013.6642455
Filename
6642455
Link To Document