DocumentCode
1831848
Title
A 16Gb/s 65nm CMOS transceiver for a memory interface
Author
Chun, Jung-Hoon ; Lee, Haechang ; Shen, Jie ; Chin, TJ ; Wu, Ting ; Shi, Xudong ; Kaviani, Kambiz ; Beyene, Wendemagegnehu ; Leibowitz, Brian ; Perego, Rich ; Chang, Ken
Author_Institution
Rambus Inc., Los Altos, CA
fYear
2008
fDate
3-5 Nov. 2008
Firstpage
25
Lastpage
28
Abstract
A transceiver for a memory controller operating at 16 Gb/s per link is implemented in 65 nm CMOS process. Timing calibration, equalization and diagnostic circuits for both memory read and write are on the controller to optimize the overall system performance and cost. A 5-tap TX FIR and a continuous time RX equalizer with active inductor loads are employed. The transceiver also includes a diagnostic circuit which can add a programmable DC differential voltage offset and produce actual eye diagrams for both write and read links. It is demonstrated that each link can operate at 16 Gb/s with a timing margin of 0.19 UI at a BER of 10-12.
Keywords
CMOS memory circuits; equalisers; error statistics; transceivers; BER; CMOS transceiver; TX FIR equalizer; active inductor loads; bit error rate; bit rate 16 Gbit/s; continuous time RX equalizer; diagnostic circuit; memory interface; memory read-write controller; programmable DC differential voltage offset; size 65 nm; CMOS process; Calibration; Circuits; Control systems; Cost function; Finite impulse response filter; Read-write memory; System performance; Timing; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
Conference_Location
Fukuoka
Print_ISBN
978-1-4244-2604-1
Electronic_ISBN
978-1-4244-2605-8
Type
conf
DOI
10.1109/ASSCC.2008.4708720
Filename
4708720
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