• DocumentCode
    1831848
  • Title

    A 16Gb/s 65nm CMOS transceiver for a memory interface

  • Author

    Chun, Jung-Hoon ; Lee, Haechang ; Shen, Jie ; Chin, TJ ; Wu, Ting ; Shi, Xudong ; Kaviani, Kambiz ; Beyene, Wendemagegnehu ; Leibowitz, Brian ; Perego, Rich ; Chang, Ken

  • Author_Institution
    Rambus Inc., Los Altos, CA
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    A transceiver for a memory controller operating at 16 Gb/s per link is implemented in 65 nm CMOS process. Timing calibration, equalization and diagnostic circuits for both memory read and write are on the controller to optimize the overall system performance and cost. A 5-tap TX FIR and a continuous time RX equalizer with active inductor loads are employed. The transceiver also includes a diagnostic circuit which can add a programmable DC differential voltage offset and produce actual eye diagrams for both write and read links. It is demonstrated that each link can operate at 16 Gb/s with a timing margin of 0.19 UI at a BER of 10-12.
  • Keywords
    CMOS memory circuits; equalisers; error statistics; transceivers; BER; CMOS transceiver; TX FIR equalizer; active inductor loads; bit error rate; bit rate 16 Gbit/s; continuous time RX equalizer; diagnostic circuit; memory interface; memory read-write controller; programmable DC differential voltage offset; size 65 nm; CMOS process; Calibration; Circuits; Control systems; Cost function; Finite impulse response filter; Read-write memory; System performance; Timing; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4244-2604-1
  • Electronic_ISBN
    978-1-4244-2605-8
  • Type

    conf

  • DOI
    10.1109/ASSCC.2008.4708720
  • Filename
    4708720