• DocumentCode
    1832066
  • Title

    On the quantification of the state-of-the-art models for skin-effect in conductors, including those with non-rectangular cross-sections

  • Author

    Curran, Brian ; Ndip, Ivan ; Guttowski, Stephan ; Reichl, Herbert

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    141
  • Lastpage
    146
  • Abstract
    Predictability of transmission line parameters in both the frequency and time-domains is very important for microelectronics packaging. Proximity effects and non-rectangular cross-sections can cause a drastic deviation in transmission line parameters from the theoretically calculated values. Filament models and full-wave techniques have offered improvements over analytical models for computing the parameters of transmission lines with arbitrary cross-sections including proximity effects. This work is an analysis of some state-of-the-art skin-effect models and a quantification of their limitations.
  • Keywords
    conductors (electric); integrated circuit packaging; proximity effect (lithography); skin effect; transmission lines; conductors; filament models; full-wave techniques; microelectronics packaging; nonrectangular cross-sections; proximity effects; skin-effect; state-of-the-art models; transmission line parameters; Conductors; Equations; Frequency; Inductance; Microelectronics; Microstrip; Packaging; Planar transmission lines; Proximity effect; Transmission line theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284564
  • Filename
    5284564