DocumentCode
1834035
Title
Comparison of the efficiency of electromagnetic solvers in the time- and frequency-domain for the accurate modeling of planar circuits and MEMS
Author
Pierantoni, L. ; Farina, M. ; Rozzi, T. ; Coccetti, F. ; Dressel, W. ; Russer, P.
Author_Institution
Dipartimento di Elettronica e Autom., Ancona Univ., Italy
Volume
2
fYear
2002
fDate
2-7 June 2002
Firstpage
891
Abstract
In this contribution we present an accurate investigation of three different techniques for the modeling of complex planar circuits. The EM analysis is performed by means of different electromagnetic full-wave solvers in the time-domain and in the frequency-domain. The first one is the transmission line matrix (TLM) method. In the second one the TLM method is combined with the integral equation (IE) method. The latter is based on the generalized transverse resonance diffraction (GTRD). In order to test the methods we model different structures and compare the calculated S-parameters to measured results, with good agreement.
Keywords
S-parameters; circuit simulation; electric field integral equations; electromagnetic field theory; electromagnetic wave diffraction; frequency-domain analysis; magnetic field integral equations; micromechanical devices; microstrip antennas; microstrip filters; time-domain analysis; transmission line matrix methods; EM analysis; EM solvers; GTRD; IE method; MEMS devices; S-parameter calculations; TLM; complex planar circuit modeling; electromagnetic full-wave solvers; frequency-domain analysis; generalized transverse resonance diffraction; integral equation method; microstrip filter; modeling technique efficiency; patch antenna; time-domain analysis; transmission line matrix method; Circuit analysis; Distributed parameter circuits; Electromagnetic analysis; Frequency domain analysis; Integral equations; Performance analysis; Planar transmission lines; Resonance; Time domain analysis; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location
Seattle, WA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7239-5
Type
conf
DOI
10.1109/MWSYM.2002.1011773
Filename
1011773
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