• DocumentCode
    1834340
  • Title

    20Gb/s 1/4-rate and 40Gb/s 1/8-rate burst-mode CDR circuits in 0.13 μm CMOS

  • Author

    Chu, Hong-Lin ; Hsieh, Chang-Lin ; Liu, Shen-Iura

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    429
  • Lastpage
    432
  • Abstract
    In this paper, 20 Gb/s 1/4-rate and 40 Gb/s 1/8-rate burst-mode clock and data recovery (BMCDR) circuits are presented. The proposed inductorless gated digitally-controlled oscillator using a digitally frequency calibration loop is presented. These two BMCDR circuits have been fabricated in 0.13..m CMOS technology. For a PRBS of 27-1, the measured peak-to-peak jitter of the recovered clock for the 20 Gb/s 1/4-rate and 40 Gb/s 1/8-rate BMCDR circuits is 23.8 ps and 51 ps, respectively.
  • Keywords
    CMOS integrated circuits; optical fibre networks; CMOS; burst-mode CDR circuits; burst-mode clock and data recovery circuits; inductorless gated digitally-controlled oscillator; Application specific integrated circuits; CMOS technology; Calibration; Clocks; Frequency locked loops; Integrated circuit technology; Jitter; Oscillators; Q measurement; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4244-2604-1
  • Electronic_ISBN
    978-1-4244-2605-8
  • Type

    conf

  • DOI
    10.1109/ASSCC.2008.4708819
  • Filename
    4708819