• DocumentCode
    1834344
  • Title

    The danger of high-frequency spurious effects on wide microstrip line

  • Author

    Mesa, F. ; Jackson, D.R.

  • Author_Institution
    Dept. of Appl. Phys. 1, Seville Univ., Spain
  • Volume
    2
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    945
  • Abstract
    It has been found that remarkably severe spurious effects can occur in the current excited on microstrip line at moderate to high frequency, when the strip is wide (w/h > 3). This newly observed effect occurs because one or more leaky modes approaches the branch point at k/sub 0/ in the complex longitudinal wavenumber plane. This effect only occurs when the strip is wide. This effect can be disastrous, since the continuous-spectrum part of the current then decays very slowly with distance from the source, so that the total strip current excited by the source exhibits spurious oscillations out to very large distances from the source. An approximate design rule for predicting this effect is given, which is accurate for wide strips (w/h > 6).
  • Keywords
    electromagnetic oscillations; microstrip lines; waveguide theory; branch point; complex longitudinal wavenumber plane; continuous-spectrum part; design rule; high-frequency spurious effects; leaky modes; spurious oscillations; total strip current; wide microstrip line; Analytical models; Crosstalk; Frequency; Geometry; Interference; Microstrip components; Permittivity; Physics computing; Strips; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011785
  • Filename
    1011785