• DocumentCode
    1835138
  • Title

    Sigma delta ADC with a dynamic reference for accurate temperature and voltage sensing

  • Author

    Saputra, N. ; Pertijs, M.A.P. ; Makinwa, K.A.A. ; Huijsing, J.H.

  • Author_Institution
    Electron. Res. Lab., Delft Univ. of Technol., Delft
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    1208
  • Lastpage
    1211
  • Abstract
    A second-order sigma-delta analog-to-digital converter (ADC) with 12-bit absolute accuracy has been designed using a 0.7 mum CMOS technology. The ADC is part of a temperature sensor, and they both share a dynamic band-gap reference voltage, which is trimmed at room temperature. By using precision techniques such as chopping, correlated double-sampling and dynamic element matching, this reference voltage has a temperature coefficient of 3.5 ppm/degC over the range -40degC to 125degC. Its curvature error is corrected at the system level by means of a look-up-table-driven feedback loop. The result is an accurate temperature sensor with, in addition, accurate voltage sensing capability. The ADC´s input dynamic range extends from 0 to VDD, for VDD ranging from 2.5 V to 5.5 V. The chip has an active area of 4.9 mm2, and a current consumption of 85 muA.
  • Keywords
    CMOS integrated circuits; choppers (circuits); circuit feedback; electric sensing devices; sigma-delta modulation; table lookup; temperature sensors; voltage measurement; 0.7 mum CMOS technology; analog-digital converter; chopping; correlated double-sampling; current 85 muA; curvature error; dynamic band-gap reference voltage; dynamic element matching; input dynamic range; look-up-table-driven feedback loop; second-order sigma delta ADC; size 0.7 mum; temperature -40 degC to 125 degC; temperature coefficient; temperature sensor; voltage 0 V to 5.5 V; voltage sensing; Analog-digital conversion; CMOS technology; Delta-sigma modulation; Dynamic range; Error correction; Feedback loop; Photonic band gap; Temperature distribution; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541641
  • Filename
    4541641