Developing a universal exchange format for near-field scan data

Near-field scan measurements and simulations generate a large amount of data. The format of the data is closely linked to the supplier of the acquisition or simulation software, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. The paper describes how a universal exchange format for near-field scan data has been developed. The format caters for various coordinate systems and is suited to emission and immunity testing both in the frequency and time domains.