• DocumentCode
    1835962
  • Title

    On Wafer Pulse Power Vector Testing

  • Author

    Mahon, John ; Ersland, Peter ; Weichert, Calvin ; Lally, Mike ; Lanteri, Jean-Pierre ; Kaputa, Doug

  • Author_Institution
    M/A-COM Advanced Semiconductor Division, 100 Chelmsford Street, Lowell, MA 01851
  • Volume
    17
  • fYear
    1990
  • fDate
    10-11 May 1990
  • Firstpage
    82
  • Lastpage
    82
  • Abstract
    Presents the title page of the conference paper.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 35th
  • Conference_Location
    Dallas, TX, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1990.323983
  • Filename
    4119553
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1835962