Comments Concerning On-Wafer Noise Parameter Measurements

The National Institute of Standards and Technology (NIST) has a goal of offering an on-wafer noise parameter special test service for 8 - 12 GHz amplifiers in 1992. This paper discusses two preliminary stages in the development of this service: the measurement of component amplifier noise parameters, and elementary on-wafer noise measurements. The measurement approach is described and the basic relationships for effective input noise temperature are reviewed. Then the measurement system is discussed and the results are presented. Finally, preliminary on-wafer noise measurements are presented.