• DocumentCode
    1837982
  • Title

    Candidate spacecraft electronics subjected to ELDRS per Mil-Std-883/method 1019.6 dose rate condition D, /spl les/10 mrad/sec

  • Author

    Meshel, David ; Love, David P. ; Peterson, Chris ; Mil, Kathleen

  • Author_Institution
    Northrop Grumman Electron. Syst., Baltimore, MD, USA
  • fYear
    2004
  • fDate
    22-22 July 2004
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    Eight linear bipolar microcircuits were subjected to Mil-Std-883 test method 1019.6 condition D. Both biased and unbiased exposures were made. Unbiased exposures in some cases are shown to have even a greater low dose rate sensitivity.
  • Keywords
    bipolar analogue integrated circuits; integrated circuit testing; military standards; radiation effects; space vehicle electronics; ELDRS; Mil-Std-883 test method 1019.6; biased exposures; dose rate condition D; enhanced low dose rate sensitivity; linear bipolar microcircuits; spacecraft electronics; unbiased exposures; Aerospace electronics; Data acquisition; Instruments; Low voltage; Manufacturing; Military standards; Space technology; Space vehicles; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2004 IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-8697-3
  • Type

    conf

  • DOI
    10.1109/REDW.2004.1352899
  • Filename
    1352899
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1837982