• DocumentCode
    1838094
  • Title

    Accuracy Considerations in Internal Node Timing Measurements of High-Performance MCMs

  • Author

    Gleason, Reed ; Smith, Ken

  • Author_Institution
    Cascade Microtech, 14255 SW Brigadoon Ct., Beaverton OR 97005, Phone (503) 626-8245 FAX (503) 626-6023
  • Volume
    22
  • fYear
    1992
  • fDate
    Dec. 1992
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    In order to take full advantage of MCM technology, it is desirable to push clock rates to the highest rate achievable. It is extremely important to accurately characterize parameters such as timing margins and undershoot conditions to pursue this goal. Probing internal nodes of MCMs is essential to optimizing their performance. This paper investigates the accuracy of signal acquisition under varying probe conditions. The effect of probe parasitic capacitance and inductance on timing measurements is measured and modeled.
  • Keywords
    Bandwidth; Capacitance measurement; Circuit testing; Clocks; Electric variables measurement; Inductance measurement; Probes; System testing; Timing; Velocity measurement; Accuracy; High speed; MCM; Measurement; Probe;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 40th
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1992.326995
  • Filename
    4119653