• DocumentCode
    1838246
  • Title

    SEE and TID results for a commercially fabricated radiation hardened field programmable gate array

  • Author

    Hafer, C. ; Lake, R. ; Jordan, A. ; Farris, T.

  • Author_Institution
    Aeroflex Colorado Springs, CO, USA
  • fYear
    2004
  • fDate
    22-22 July 2004
  • Firstpage
    85
  • Lastpage
    87
  • Abstract
    Aeroflex´s RadHard-by-Design commercially fabricated field programmable gate array provides a radiation hardened quick-turn solution to aerospace IC users. Characterization results for single event upset, single event latchup and total ionizing dose are presented.
  • Keywords
    field programmable gate arrays; integrated circuit testing; ion beam effects; radiation hardening (electronics); FPGA; SEE; TID; aerospace IC; field programmable gate array; ion beam; radiation hardened FPGA; single event latchup; single event upset; total ionizing dose; Circuit testing; Clocks; Cyclotrons; Field programmable gate arrays; Integrated circuit testing; Logic; Radiation hardening; Semiconductor device testing; Shift registers; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2004 IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-8697-3
  • Type

    conf

  • DOI
    10.1109/REDW.2004.1352910
  • Filename
    1352910
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838246