• DocumentCode
    1838281
  • Title

    Interconnection Transmission Line Parameter Characterization

  • Author

    Marks, Roger B. ; Williams, Dylan F.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
  • Volume
    22
  • fYear
    1992
  • fDate
    Dec. 1992
  • Firstpage
    88
  • Lastpage
    95
  • Abstract
    This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
  • Keywords
    Capacitance; Coplanar transmission lines; Coplanar waveguides; Dielectric losses; Dielectric substrates; Dispersion; Inductance; Propagation losses; Silicon; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 40th
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1992.327004
  • Filename
    4119662
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838281