DocumentCode
1838673
Title
Current-mode image sensor with 1.5 transistors per pixel and improved dynamic range
Author
Yang, Zheng ; Gruev, Viktor ; Van der Spiegel, Jan
Author_Institution
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA
fYear
2008
fDate
18-21 May 2008
Firstpage
1850
Lastpage
1853
Abstract
This paper describes a current-mode active pixel sensor (APS) for low supply voltage, low noise and high resolution/high speed imaging applications. The imager is designed in a standard 0.25 mum 2.5 V CMOS process. A transistor count of 1.5 per pixel is achieved through transistor sharing and floating diffusion (FD) based addressing. Highly linear current readout in velocity saturation, as well as triple sampling (TS), are used to reduce fixed pattern noise (FPN). Dynamic range (DR) is improved through FD presetting and boosting techniques, which allow the full-well capacity of photodiodes to be utilized without degrading readout linearity. Post-extraction simulation results on FPN and DR are presented, and compared favorably to a conventional 3-transistor pixel design.
Keywords
CMOS image sensors; current-mode circuits; photodiodes; CMOS process; current-mode active pixel sensor; current-mode image sensor; fixed pattern noise reduction; floating diffusion addressing; linear current readout; photodiodes; size 0.25 mum; transistor sharing addressing; triple sampling; velocity saturation; voltage 2.5 V; Active noise reduction; CMOS process; Dynamic range; High-resolution imaging; Image resolution; Image sampling; Image sensors; Low voltage; Pixel; Sensor phenomena and characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541801
Filename
4541801
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