• DocumentCode
    1838734
  • Title

    Interconnect simulation using order reduction and scattering parameters

  • Author

    Beyene, Wendemagegnehu T. ; Schutt-Ainé, José E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    627
  • Lastpage
    631
  • Abstract
    This paper demonstrates the use of scattering parameters for efficient and accurate simulation of transmission lines. First, a low-order rational approximation scheme is applied to the s parameters of the line system, next an appropriate reference system is chosen to optimize the formulation. Finally, the low-order rational approximations of the scattering parameters are directly implemented in conventional time-domain simulator using recursive convolution. Experimental results are used to validate the computer simulations
  • Keywords
    S-parameters; integrated circuit interconnections; integrated circuit modelling; reduced order systems; transmission line theory; computer simulation; interconnect; order reduction; rational approximation; recursive convolution; scattering parameters; time-domain simulator; transmission line; Computational modeling; Convolution; Differential equations; Frequency; Propagation losses; Scattering parameters; Time domain analysis; Transmission line matrix methods; Transmission line measurements; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678761
  • Filename
    678761