DocumentCode
1840146
Title
Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results
Author
Righter, Alan ; Welsher, Terry ; Farris, Marti ; Johnson, Marty ; Ward, Scott ; Dekker, Marcel ; Maloney, Tim ; Ashton, Robert ; Henry, Leo G. ; Meuse, Tom ; Barth, Jon ; Grund, Evan ; Smedes, Theo ; Ngan, Paul
Author_Institution
Analog Devices, Wilmington, MA, USA
fYear
2012
fDate
9-14 Sept. 2012
Firstpage
10
Lastpage
10
Abstract
Progress toward a joint ESDA/JEDEC CDM standard is described. A “10 ohm CDM” test head experiment comparison to JEDEC standard testing is discussed. A second experiment (field plate dielectric thickness variation / ESDA test head) is described. Oscilloscope bandwidth / filtering, test head response, attenuators, and module effects are discussed.
Keywords
attenuators; electron device testing; electrostatic discharge; oscilloscopes; test equipment; ESDA test head; JEDEC standard testing; attenuator; charged device model; electrostatic discharge; field plate dielectric thickness variation; joint ESDA-JEDEC CDM standard; oscilloscope bandwidth; test head response; Bandwidth; Current measurement; Discharges (electric); Hardware; Oscilloscopes; Probes; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Conference_Location
Tucson, AZ
ISSN
0739-5159
Print_ISBN
978-1-4673-1467-1
Type
conf
Filename
6333283
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