• DocumentCode
    1840219
  • Title

    Suppression of multi-path couplings in MCM with a flip-chipped SiGe-MMIC

  • Author

    Nishino, T. ; Maeda, K. ; Shimozawa, M. ; Ikushima, T. ; Sadahiro, K. ; Katsura, T. ; Suematsu, N. ; Itoh, K. ; Oohashi, H. ; Takagi, T. ; Ishida, O.

  • Author_Institution
    Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kanagawa, Japan
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1385
  • Abstract
    Techniques to obtain a high isolation property in a multi-chip module (MCM) between pads of a SiGe-MMIC flip-chipped on a low temperature co-fired ceramic (LTCC) are discussed. In such an MCM, there are two coupling paths. One is a path through the LTCC and the other is a path through the MMIC. To improve the total isolation property, structures to reduce the two coupling paths are required because the paths of such leakage are not in series but in parallel. We examined the disposition of several kinds of ground patterns on the LTCC. Also, we devised a metal plate on a bias circuit as a shielding structure on the SiGe-MMIC. The effectiveness of the isolating structures was verified by measuring IIP2 in a receiver MCM with a direct conversion SiGe-MMIC. The IIP2 property has been improved successfully as well as the isolation property.
  • Keywords
    Ge-Si alloys; MMIC; electromagnetic coupling; electromagnetic shielding; flip-chip devices; multichip modules; semiconductor materials; LTCC; MCM; SiGe; SiGe MMIC pads; bias circuit; flip-chipped SiGe MMIC; ground patterns; high isolation property; isolating structures; low temperature co-fired ceramic; metal plate shielding structure; multi-chip module; multi-path couplings suppression; Business communication; Circuit simulation; Costs; Coupling circuits; Information technology; MMICs; Mobile communication; Research and development; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012113
  • Filename
    1012113