Proposal of Up-to-Date Standards on Methods of Measuring Noise Parameters of Microwave Transistors

One of the most interesting topics for microrwave community is the characterization of low-noise transistors. After so many years, the Standards suggested by IEEE in 1960 are considered obsolete by the experimenters. A new methodology is here proposed as a standard. To support this proposal, an original measuring system for the complete characterization of microwave transistors in terms of noise, gain and scattering parameters from noise figure measurements only is presented.