DocumentCode
1840622
Title
The impact of e-diagnostics - one year later
Author
Locy, Michael
Author_Institution
KLA-Tencor, San Jose, CA, USA
fYear
2001
fDate
2001
Firstpage
435
Lastpage
438
Abstract
Initially, the industry viewed e-diagnostics as a way to collect, trend, and extract potential failure points from equipment, as well as to provide the ability for a remote service engineer to gain access to equipment for trouble shooting. As e-diagnostics progressed, the industry needed to implement an e-diagnostics enabling solution that not only collected and analyzed data, but also delivered true added value support with the goal of making tools more productive. KLA-Tencor\´s iSupport e-Diagnostics program was the first in the industry to design a solution integrating a value-added support program with e-diagnostics technology. During the first year of iSupport connectivity to worldwide customer sites, the program focused on assisting users with "Reactive" and "Escalation" support calls. This paper addresses the background, success cases, and value experienced by many iSupport customers throughout this first year of operation. Additionally, this paper addresses the iSupport road map, where predictive failure monitoring holds much promise
Keywords
computerised monitoring; failure analysis; maintenance engineering; production engineering computing; semiconductor device manufacture; Escalation support; KIA-Tencor iSupport; Reactive support; e-diagnostics technology; predictive failure monitoring; remote servicing; semiconductor manufacturing equipment; trouble shooting; value-added support program; Condition monitoring; Data analysis; Data mining; Data security; Foundries; Inspection; Lead compounds; Manufacturing industries; Microwave integrated circuits; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location
San Jose, CA
Print_ISBN
0-7803-6731-6
Type
conf
DOI
10.1109/ISSM.2001.963009
Filename
963009
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