Electric-field observation of pico-pulse propagation on right-angle bends by miniature photoconductive near-field probe

Author

Jongjoo Lee ; Joungho Kim

Author_Institution

Dept. of Electron. Eng. & Comput. Sci., KAIST, Daejeon, South Korea

Volume

3

fYear

2002

fDate

2-7 June 2002

Firstpage

1509

Abstract

The picosecond electric-pulse propagation characteristics on microstrip and coplanar waveguide right-angle bends have been successfully measured by mapping the time-dependent spatial electric near-field distributions. The measurement was performed using a 2-dimensional photoconductive (PC) electric near-field mapping system incorporating a new miniature PC electric-field probe, which was implemented on an optical fiber by coupling a PC switch on 1-/spl mu/m-thick LT-GaAs epilayer to the end-facet of a 45/spl deg/ bevel-edge optical fiber. The probe could measure the three orthogonal picosecond electric-field components separately with minimal loading effects. The measured field-images showed quite remarkable transient picosecond electric-pulse propagation phenomena at the right-angle bends, which cannot be measured using conventional test instruments.

Keywords

coplanar waveguides; electric field measurement; microstrip discontinuities; photoconducting switches; probes; waveguide discontinuities; 1 micron; 2D photoconductive electric field mapping system; CPW bends; GaAs; GaAs epilayer probe head; LT-GaAs epilayer; bevel-edge optical fiber; coplanar waveguide bends; electric near-field distributions; electric-field observation; microstrip bends; miniature near-field probe; photoconductive near-field probe; photoconductive switch; picosecond electric-pulse propagation characteristics; right-angle bends; time-dependent spatial distributions; transient propagation phenomena; ultrafast signal propagation diagnosis; Coplanar waveguides; Electric variables measurement; Microstrip; Optical coupling; Optical fibers; Optical propagation; Optical waveguides; Performance evaluation; Photoconductivity; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2002 IEEE MTT-S International

Conference_Location

Seattle, WA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7239-5

Type

conf

DOI

10.1109/MWSYM.2002.1012142

Filename

1012142