• DocumentCode
    1841044
  • Title

    Key Considerations in RFIC Production Test

  • Author

    Barr, John

  • Author_Institution
    RF Manufacturing Test Engineering Manager, Santa Rosa System Division, Hewlett Packard
  • Volume
    27
  • fYear
    1995
  • fDate
    34820
  • Firstpage
    36
  • Lastpage
    45
  • Abstract
    In the highly competitive world of RFICs and Wireless Communications, component production test plays a key role. While the main objective is to test the most product possible in the least amount of time and minimal added cost, many key factors need to be considered to successfully achieve that goal. This paper addresses those key considerations and provide insight into successfully achieving the goals of RFIC production test.
  • Keywords
    Circuit testing; Costs; Integrated circuit testing; Life testing; Manufacturing; Production systems; Radio frequency; Radiofrequency integrated circuits; System testing; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 45th
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1995.327104
  • Filename
    4119781
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1841044