• DocumentCode
    1842608
  • Title

    Platform based design of all binary motion estimation (ABME) with bus interleaved architecture

  • Author

    Shih-Hao Wang ; Tao, Wei-Lun ; Chung-Neng Wang ; Peng, Wen-Hsiao ; Chiang, Tihao

  • Author_Institution
    Dept. of Electron. Eng., National Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2005
  • fDate
    27-29 April 2005
  • Firstpage
    241
  • Lastpage
    244
  • Abstract
    This paper presents an efficient hardware-software implementation with a macroblock based pipelining and a bus interlaced architecture for all binary motion estimation (ABME), which has been proven to be simple and low cost for hardware design. The bus interleaved preprocessing module of the ABME architecture can generate downsampling and binarized data in the same flow without additional dedicated hardware. With the 3-layer binary bitplane of ABME, the authors used a two-dimensional (2-D) mapping unit and a binary adder tree instead of a systolic array to compute the block matching metric, which is sum of difference (SoD), in one cycle. In addition, a new bus bandwidth reduction scheme is proposed by reusing the binarized image, which can achieve up to 67% bus bandwidth saving. The experiment shows that for each macroblock, the design could finish ABME within 283 cycles with 65k gate counts synthesized by UMC 0.18μm cell library.
  • Keywords
    adders; digital signal processing chips; hardware description languages; hardware-software codesign; system buses; 2D mapping unit; all binary motion estimation; binarized data; binary adder tree; block matching metric; bus bandwidth reduction scheme; bus interleaved architecture; downsampling; hardware-software implementation; macroblock; pipelining; platform based design; Bandwidth; Chip scale packaging; Computational complexity; Computer architecture; Embedded software; Embedded system; Hardware; Libraries; Motion estimation; Video compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
  • Print_ISBN
    0-7803-9060-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2005.1500065
  • Filename
    1500065