DocumentCode
1843001
Title
Design techniques for INL and jitter prediction of a 3.3V 16b 65MSps pipeline ADC core
Author
Zanchi, Alfio ; Tsay, Frank
Author_Institution
High-Speed ADC, Texas Instruments, Inc, Dallas, TX, USA
fYear
2005
fDate
27-29 April 2005
Firstpage
303
Lastpage
306
Abstract
This work introduces design techniques and experimental results relative to a 16b 65MSps pipeline ADC core implemented in 0.4μm, 45GHz-fr SiGe BiCMOS. A fast methodology for simulating the INL with Spice enables the implementation of low-distortion sample/hold and quantizer at 3.3V supply and high input range (4Vpp). Accurate prediction of aperture uncertainty allow the optimization of the on-chip clock circuit, yielding 180fs RMS jitter and 73.5dBFS SNR at 150MHz input. The test chip delivers 78.3dBFS SNR, 88dBc SFDR at 65MSps, 1MHz and 970mW consumption with external voltage references.
Keywords
BiCMOS digital integrated circuits; analogue-digital conversion; circuit simulation; 0.4 micron; 1 MHz; 150 MHz; 16 bit; 3.3 V; 970 mW; INL; SiGe BiCMOS; Spice; circuit simulation; jitter prediction; pipeline ADC core; Apertures; BiCMOS integrated circuits; Circuit simulation; Circuit testing; Clocks; Germanium silicon alloys; Jitter; Pipelines; Silicon germanium; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN
0-7803-9060-1
Type
conf
DOI
10.1109/VDAT.2005.1500081
Filename
1500081
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