Accuracy limitations of perfectly matched layers in 3D finite-difference frequency-domain method

Author

Tischler, T. ; Heinrich, W.

Author_Institution

Ferdinand-Braun-Inst. fur Hochsfrequenstech., Berlin, Germany

Volume

3

fYear

2002

fDate

2-7 June 2002

Firstpage

1885

Abstract

The perfectly matched layer (PML) boundary condition is employed in conjunction with the 3D finite-difference frequency-domain method (FDFD) for S parameter calculation of microwave devices. We find a residual reflection error, which is related only to discretization at the PML interface. The paper presents a systematic investigation of this parasitic effect and its origin.

Keywords

S-parameters; boundary-value problems; dielectric-loaded waveguides; electromagnetic wave absorption; finite difference methods; frequency-domain analysis; parallel plate waveguides; waveguide theory; 3D finite-difference frequency-domain method; Maxwellian equations; S parameter calculation; absorbing boundary conditions; accuracy limitations; conductivity profile; dielectric loaded waveguide; discretization; microwave devices; parallel-plate waveguide; parasitic effect; perfectly matched layer boundary condition; residual reflection error; Anisotropic magnetoresistance; Boundary conditions; Dielectrics; Finite difference methods; Integral equations; Iron; Maxwell equations; Perfectly matched layers; Reflection; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2002 IEEE MTT-S International

Conference_Location

Seattle, WA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7239-5

Type

conf

DOI

10.1109/MWSYM.2002.1012231

Filename

1012231