2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT) (IEEE Cat. No. 05TH8803)

fYear

2005

fDate

27-29 April 2005

Abstract

The following topics are dealt with: VLSI; system on chip; formal verification; integrated circuit testing; low power communications; reconfigurable architectures; electronic design automation; wireless communications; mixed signal circuits; analog circuits; RF circuits; BiCMOS integrated circuits; CMOS integrated circuits; hardware-software codesign; SoC testing; SoC design; driver circuits; buffer circuits; analog-digital converters; embedded processors.

Keywords

BiCMOS integrated circuits; CMOS integrated circuits; VLSI; analogue circuits; analogue-digital conversion; buffer circuits; digital signal processing chips; driver circuits; electronic design automation; hardware-software codesign; integrated circuit layout; integrated circuit testing; low-power electronics; mixed analogue-digital integrated circuits; reconfigurable architectures; system-on-chip; BiCMOS integrated circuits; CMOS integrated circuits; SoC design; SoC testing; VLSI; analog circuits; analog-digital converters; buffer circuits; driver circuits; electronic design automation; embedded processors; hardware-software codesign; integrated circuit testing; low power communications; mixed signal circuits; reconfigurable architectures; system on chip; wireless communications;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on

Conference_Location

Hsinchu, Taiwan

Print_ISBN

0-7803-9060-1

Type

conf

DOI

10.1109/VDAT.2005.1500094

Filename

1500094