DocumentCode
1843864
Title
Performance Optimization of Ka-Band MMIC Power Amplifier Using On-Wafer Pulsed Power Test
Author
Yang, D.C. ; Yang, J.M. ; Nussembaumer, P.J. ; Biedenbender, M.D.
Author_Institution
TRW Inc., RF Product Center, Redondo Beach, CA 90278
Volume
31
fYear
1997
fDate
35582
Firstpage
132
Lastpage
135
Abstract
A novel technique has been developed to optimize the power MMIC performance by using on-wafer pulsed power test. Traditionally, only dc parameters were used to determine the chip operating bias condition. The on-wafer test was used to determine the functionality of the device, and the MMIC chip performance is optimized through manual bias tuning at module level. This technique provides significant cost savings in high volume production environment.
Keywords
Circuit testing; MMICs; Optimization; Power amplifiers; Probes; Pulse amplifiers; Radio frequency; Radiofrequency amplifiers; Scattering parameters; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 49th
Conference_Location
Denver, CO, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1997.327220
Filename
4119905
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