• DocumentCode
    1844192
  • Title

    An Accurate Determination of the Characteristic Impedance Matrix of Coupled Symmetrical Lines on Chips Baser on High Frequency S-Parameter Measurements

  • Author

    Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut

  • Author_Institution
    IBM, Schönaicher Str. 220, 71032 Böblingen, Germany
  • Volume
    31
  • fYear
    1997
  • fDate
    35582
  • Firstpage
    223
  • Lastpage
    226
  • Abstract
    A new method has been developed to determine the characteristic impedance matrix of a symmetric coupled lossy two line system on chips. The presented results are based on high frequency measurements of the scattering parameters. A comparison between the measured and analytical calculated results is given and shows excellent agreement.
  • Keywords
    Calibration; Frequency measurement; Impedance measurement; Microwave theory and techniques; Probes; Scattering parameters; Semiconductor device measurement; Silicon; Symmetric matrices; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 49th
  • Conference_Location
    Denver, CO, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1997.327232
  • Filename
    4119917
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844192