• DocumentCode
    1844795
  • Title

    Prognosis of electrical faults in permanent magnet AC machines using the hidden Markov model

  • Author

    Zaidi, Syed Sajjad Haider ; Zanardelli, Wesley G ; Aviyente, Selin ; Strangas, Elias G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    2634
  • Lastpage
    2640
  • Abstract
    Reliable and fault free operation of machines needs not only timely fault detection and classification, but also an estimate of its remaining useful life, resulting in two phases of systems health monitoring, diagnosis and prognosis. Both share commonalities, with prognosis being the succeeding phase of diagnosis. In this paper, a prognosis algorithm based on the statistical hidden Markov model, is presented for the electrical faults of permanent magnet AC machines. The model parameters are computed by using the training outputs of the diagnosis phase. The algorithm estimates the failure state probability for each sampled observation. Time-frequency features extracted from the torque producing component of the machine current is used as the health indicator. The remaining useful life is estimated in terms of the probability of failure state. Parameter training of Hidden Markov Models generally need huge amounts of historical data, which are often not available in the case of highly reliable electrical machines. A method, which uses experimental observations, is presented for the computation of the state dependent observation probability densities from the limited data.
  • Keywords
    AC machines; fault diagnosis; feature extraction; hidden Markov models; machine theory; permanent magnet machines; probability; time-frequency analysis; electrical fault prognosis algorithm; failure state probability; fault classification; fault detection; fault diagnosis; health indicator; permanent magnet AC machines; state dependent observation probability density; statistical hidden Markov model; system health monitoring; time-frequency feature extraction; Feature extraction; Hidden Markov models; Prediction algorithms; Probability; Time frequency analysis; Training; Transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5675138
  • Filename
    5675138