• DocumentCode
    1845273
  • Title

    DBTG: Demand-Driven Backtracking Test Generation

  • Author

    Cheng, Shaoyin ; Jiang, Fan ; Wang, Jiajie ; Zhang, Tao ; Xing, Xuezhi

  • Author_Institution
    Univ. of Sci. & Technol. of China
  • fYear
    2008
  • fDate
    18-21 Nov. 2008
  • Firstpage
    1944
  • Lastpage
    1950
  • Abstract
    Test generation techniques are still weak, especially to large or complex programs. This paper presents a new test generation method, which can automatically generate inputs triggering bugs with greatly mitigating the path explosion problem. The method performs intraprocedural analysis to find potential bugs using a combined symbolic and concrete execution with simplifying callee functions; then backtracks from the bug statement to program entry to find interprocedural paths with pruning infeasible paths in due course; finally expands callee functions of these paths to prune infeasible paths again. Demand-driven means that as few paths as possible are explored in order to find feasible paths triggering bugs. We have implemented a tool based on Phoenix framework and Z3 solver. To the best of our knowledge, it is the first security analysis tool working on intermediate representation between source and binary using a combined symbolic and concrete execution. Preliminary experiments on real code of nbsmtp SMTP client are promising.
  • Keywords
    backtracking; program debugging; program diagnostics; program testing; Phoenix framework; SMTP client; Z3 solver; callee function; combined symbolic-concrete execution; demand-driven backtracking test generation; intraprocedural analysis; path explosion problem; security analysis tool; triggered bug detection; Automatic testing; Certification; Computer bugs; Computer security; Concrete; Explosions; Information security; Information technology; Performance analysis; Software testing; Automatic test generation; backtracking; bug finding; demand-driven; symbolic execution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Young Computer Scientists, 2008. ICYCS 2008. The 9th International Conference for
  • Conference_Location
    Hunan
  • Print_ISBN
    978-0-7695-3398-8
  • Electronic_ISBN
    978-0-7695-3398-8
  • Type

    conf

  • DOI
    10.1109/ICYCS.2008.211
  • Filename
    4709271