DocumentCode
1846683
Title
Measuring the Characteristics of Modulated Non-Linear Devices
Author
Rolain, Yves ; van Moer, Wendy ; Vael, Philip
Author_Institution
Vrije Universiteit Brussel - Dept. ELEC/TW Pleinlaan, 2 B-1050 Brussel Phone: +32.2.629.29.44, Fax: +32.2.629.28.50, Email: Yves.Rolain@vub.ac.be
Volume
35
fYear
1999
fDate
36312
Firstpage
1
Lastpage
9
Abstract
A flexible and reconfigurable measurement setup for non-linear devices is proposed. It combines the advantages of a reconfigurable instrument and interchangeability of the instrumentation modules. To show the framework capability, the non-linear characterisation of an amplifier in the 900 MHz band under cw and modulated excitation is presented. The spectral regrowth is hereby fully characterised in amplitude and phase.
Keywords
Data processing; Distortion measurement; Frequency; Gain measurement; Impedance; Instruments; Performance evaluation; Phase measurement; Power measurement; Relational databases;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 53rd
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1999.327339
Filename
4120032
Link To Document