DocumentCode
1847854
Title
Why are Non-Linear Microwave Systems Measurements so Involved?
Author
Rolain, Yves ; van Moer, Wendy ; Vandersteen, Gerd ; Schoukens, Johan
Author_Institution
Vrije Universiteit Brussel, dept ELEC, Pleinlaan,2 B-1050 Brussel (Belgium)
Volume
37
fYear
2000
fDate
15-16 June 2000
Firstpage
1
Lastpage
8
Abstract
Performing nonlinear measurements on microwave devices is a complex task. This paper introduces step by step the key concepts that make the difference between linear S-parameter measurements and nonlinear measurements. The main goal here is to make nonlinear measurements more accessible to the practicing microwave engineer.
Keywords
Bandwidth; Convolution; Frequency; Instruments; Linear systems; Measurement techniques; Microwave devices; Microwave measurements; Performance evaluation; Power system modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 55th
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2000.327392
Filename
4120084
Link To Document