Extraction of Transistor Large Signal Models from Vector Nonlinear Network Analyzers

A vector nonlinear network analyzer (VNNA) measurement system, based on the HP Microwave Transition Analyzer (MTA), has recently been developed. This system allows both two-port small signal S parameter measurements in the frequency domain and large signal waveform measurements in the time domain. This capability makes it an ideal tool to generate and verify nonlinear transistor models with a unique measurement system. Two different large signal model extraction approaches are presented in this paper utilizing exclusively the VNNA system. One is based on the classical indirect approach of using small signal measurements, and the other is based on the use of large signal waveform measurements.