DocumentCode
1847885
Title
Modeling and Detecting Deep Brain Activity with MEG & EEG
Author
Attal, Y. ; Bhattacharjee, M. ; Yelnik, J. ; Cottereau, B. ; Lefevre, J. ; Okada, Y. ; Bardinet, E. ; Chupin, M. ; Baillet, S.
Author_Institution
Univ. of Paris6, Paris
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
4937
Lastpage
4940
Abstract
We introduce an anatomical and electrophysiological model of deep brain structures dedicated to magnetoencephalography (MEG) and electroencephalography (EEG) source imaging. So far, most imaging inverse models considered that MEG/EEG surface signals were predominantly produced by cortical, hence superficial, neural currents. Here we question whether crucial deep brain structures such as the basal ganglia and the hippocampus may also contribute to distant, scalp MEG and EEG measurements. We first design a realistic anatomical and electrophysiological model of these structures and subsequently run Monte-Carlo experiments to evaluate the respective sensitivity of the MEG and EEG to signals from deeper origins. Results indicate that MEG/EEG may indeed localize these deeper generators, which is confirmed here from experimental MEG data reporting on the modulation of alpha brain waves.
Keywords
Monte Carlo methods; bioelectric phenomena; brain models; electroencephalography; magnetoencephalography; neurophysiology; EEG; MEG; Monte-Carlo experiments; alpha brain waves; anatomical model; basal ganglia; brain structures; deep brain activity; electroencephalography; electrophysiological model; hippocampus; inverse models; magnetoencephalography; Anatomical structure; Anatomy; Basal ganglia; Brain modeling; Electroencephalography; Hippocampus; Image segmentation; Inverse problems; Magnetic resonance imaging; Scalp; Basal Ganglia; Brain; Electroencephalography; Electrophysiology; Hippocampus; Humans; Magnetoencephalography; Models, Biological; Models, Neurological; Visual Perception;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4353448
Filename
4353448
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